Analyzing the hg1-xCdxTe single crystal slices by using the scanning photoluminescence technique

Yong Chang; Junhao Chu; Wenguo Tang; Wenzhong Shen; Wenying Mao; Dingyuan Tang

Analyzing the hg_1-xCd_xTe single crystal slices by using the scanning photoluminescence technique

Yong Chang^*
, Junhao Chu
, Wenguo Tang
, Wenzhong Shen
, Wenying Mao
, Dingyuan Tang

^*Corresponding author for this work

CAS - Shanghai Institute of Technical Physics

Research output: Contribution to journal › Article › peer-review

Abstract

The Fourier transform infrared scanning photoluminescence analysis was used to study the HgCdTe bulk crystal slices, by using which, not only the 2-D distribution of the composition, but also the distribution of the ratio of radiative recombination lifetime to the non-equilibrium carrier lifetime can be obtained. Since this analyzing method is simple, fast, contactless, and non-destructive, it can be conveniently used in the process of HgCdTe-material growth and HgCdTe-devices manufacturing for quality control.

Original language	English
Pages (from-to)	412-416
Number of pages	5
Journal	Hongwai Yu Haomibo Xuebao/Journal of Infrared and Millimeter Waves
Volume	15
Issue number	6
State	Published - Dec 1996
Externally published	Yes

Cite this

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title = "Analyzing the hg1-xCdxTe single crystal slices by using the scanning photoluminescence technique",

abstract = "The Fourier transform infrared scanning photoluminescence analysis was used to study the HgCdTe bulk crystal slices, by using which, not only the 2-D distribution of the composition, but also the distribution of the ratio of radiative recombination lifetime to the non-equilibrium carrier lifetime can be obtained. Since this analyzing method is simple, fast, contactless, and non-destructive, it can be conveniently used in the process of HgCdTe-material growth and HgCdTe-devices manufacturing for quality control.",

author = "Yong Chang and Junhao Chu and Wenguo Tang and Wenzhong Shen and Wenying Mao and Dingyuan Tang",

year = "1996",

month = dec,

language = "英语",

volume = "15",

pages = "412--416",

journal = "Hongwai Yu Haomibo Xuebao/Journal of Infrared and Millimeter Waves",

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T1 - Analyzing the hg1-xCdxTe single crystal slices by using the scanning photoluminescence technique

AU - Chang, Yong

AU - Chu, Junhao

AU - Tang, Wenguo

AU - Shen, Wenzhong

AU - Mao, Wenying

AU - Tang, Dingyuan

PY - 1996/12

Y1 - 1996/12

N2 - The Fourier transform infrared scanning photoluminescence analysis was used to study the HgCdTe bulk crystal slices, by using which, not only the 2-D distribution of the composition, but also the distribution of the ratio of radiative recombination lifetime to the non-equilibrium carrier lifetime can be obtained. Since this analyzing method is simple, fast, contactless, and non-destructive, it can be conveniently used in the process of HgCdTe-material growth and HgCdTe-devices manufacturing for quality control.

AB - The Fourier transform infrared scanning photoluminescence analysis was used to study the HgCdTe bulk crystal slices, by using which, not only the 2-D distribution of the composition, but also the distribution of the ratio of radiative recombination lifetime to the non-equilibrium carrier lifetime can be obtained. Since this analyzing method is simple, fast, contactless, and non-destructive, it can be conveniently used in the process of HgCdTe-material growth and HgCdTe-devices manufacturing for quality control.

UR - https://www.scopus.com/pages/publications/0030410441

M3 - 文章

AN - SCOPUS:0030410441

SN - 1001-9014

VL - 15

SP - 412

EP - 416

JO - Hongwai Yu Haomibo Xuebao/Journal of Infrared and Millimeter Waves

JF - Hongwai Yu Haomibo Xuebao/Journal of Infrared and Millimeter Waves

IS - 6

ER -

Analyzing the hg_1-xCd_xTe single crystal slices by using the scanning photoluminescence technique

Abstract

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