An approach to determining parasitic elements for laser diodes

  • Gao Jianjun*
  • , Gao Baoxin
  • , Pan Bo
  • , Liang Chunguang
  • *Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

5 Scopus citations

Abstract

A simple way to extract the parasitic elements of the laser diode model is proposed. The parasitic elements are determined by directly using measured S11 parameters versus frequency at zero bias point and above threshold current bias point. Thus the need for optimization during the extraction is reduced, and excellent agreement has been achieved between the experimental and calculated results.

Original languageEnglish
Pages (from-to)191-193
Number of pages3
JournalMicrowave and Optical Technology Letters
Volume34
Issue number3
DOIs
StatePublished - 5 Aug 2002
Externally publishedYes

Keywords

  • Laser diode
  • Modeling
  • Parameter extraction

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