Abstract
A simple way to extract the parasitic elements of the laser diode model is proposed. The parasitic elements are determined by directly using measured S11 parameters versus frequency at zero bias point and above threshold current bias point. Thus the need for optimization during the extraction is reduced, and excellent agreement has been achieved between the experimental and calculated results.
| Original language | English |
|---|---|
| Pages (from-to) | 191-193 |
| Number of pages | 3 |
| Journal | Microwave and Optical Technology Letters |
| Volume | 34 |
| Issue number | 3 |
| DOIs | |
| State | Published - 5 Aug 2002 |
| Externally published | Yes |
Keywords
- Laser diode
- Modeling
- Parameter extraction