Abstract
Analytical expressions for the short-circuit current gain and unilateral power gain of common emitter heterojunction bipolar transistor (HBT) are presented in this paper. These expressions are derived from a simplified π-type small signal equivalent circuit model, which takes into account the influence of the extrinsic resistances and base-collector capacitance distributed nature. Good agreement is obtained between measured and calculated results for both two indium phosphide (InP) HBT devices and a gallium arsenide (GaAs) HBT device over a wide range of bias points.
| Original language | English |
|---|---|
| Article number | e2545 |
| Journal | International Journal of Numerical Modelling: Electronic Networks, Devices and Fields |
| Volume | 33 |
| Issue number | 3 |
| DOIs | |
| State | Published - 1 May 2020 |
Keywords
- heterojunction bipolar transistor
- parameter extraction
- short-circuit current gain
- small signal model
- unilateral power gain