An approach for microprobe measurement and modeling for millimeter-wave application

Xiuping Li; Jianjun Gao; Choi Look Law; Sheel Aditya

An approach for microprobe measurement and modeling for millimeter-wave application

Xiuping Li^*
, Jianjun Gao
, Choi Look Law
, Sheel Aditya

^*Corresponding author for this work

Nanyang Technological University
Technical University of Berlin

Research output: Contribution to journal › Conference article › peer-review

Abstract

This paper describes a simple method to check the performance of microprobe, since it will directly affect the accuracy of measurement results. The two-port S-parameters of the microprobe are determined by one-port S-parameters measurement using HP 8510XF Network Analyzer. Based on the measurement, an equivalent circuit model is given and good agreement between the measurement results and modeling results is obtained.

Original language	English
Pages (from-to)	216-219
Number of pages	4
Journal	AP-S International Symposium (Digest) (IEEE Antennas and Propagation Society)
Volume	3
State	Published - 2003
Externally published	Yes
Event	2003 IEEE International Antennas and Propagation Symposium and USNC/CNC/URSI North American Radio Science Meeting - Columbus, OH, United States Duration: 22 Jun 2003 → 27 Jun 2003

Cite this

@article{c64638cf217640cf9647002cfd8044da,

title = "An approach for microprobe measurement and modeling for millimeter-wave application",

abstract = "This paper describes a simple method to check the performance of microprobe, since it will directly affect the accuracy of measurement results. The two-port S-parameters of the microprobe are determined by one-port S-parameters measurement using HP 8510XF Network Analyzer. Based on the measurement, an equivalent circuit model is given and good agreement between the measurement results and modeling results is obtained.",

author = "Xiuping Li and Jianjun Gao and Law, \{Choi Look\} and Sheel Aditya",

year = "2003",

language = "英语",

volume = "3",

pages = "216--219",

journal = "AP-S International Symposium (Digest) (IEEE Antennas and Propagation Society)",

issn = "1522-3965",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

note = "2003 IEEE International Antennas and Propagation Symposium and USNC/CNC/URSI North American Radio Science Meeting ; Conference date: 22-06-2003 Through 27-06-2003",

}

TY - JOUR

T1 - An approach for microprobe measurement and modeling for millimeter-wave application

AU - Li, Xiuping

AU - Gao, Jianjun

AU - Law, Choi Look

AU - Aditya, Sheel

PY - 2003

Y1 - 2003

N2 - This paper describes a simple method to check the performance of microprobe, since it will directly affect the accuracy of measurement results. The two-port S-parameters of the microprobe are determined by one-port S-parameters measurement using HP 8510XF Network Analyzer. Based on the measurement, an equivalent circuit model is given and good agreement between the measurement results and modeling results is obtained.

AB - This paper describes a simple method to check the performance of microprobe, since it will directly affect the accuracy of measurement results. The two-port S-parameters of the microprobe are determined by one-port S-parameters measurement using HP 8510XF Network Analyzer. Based on the measurement, an equivalent circuit model is given and good agreement between the measurement results and modeling results is obtained.

UR - https://www.scopus.com/pages/publications/0042443348

M3 - 会议文章

AN - SCOPUS:0042443348

SN - 1522-3965

VL - 3

SP - 216

EP - 219

JO - AP-S International Symposium (Digest) (IEEE Antennas and Propagation Society)

JF - AP-S International Symposium (Digest) (IEEE Antennas and Propagation Society)

T2 - 2003 IEEE International Antennas and Propagation Symposium and USNC/CNC/URSI North American Radio Science Meeting

Y2 - 22 June 2003 through 27 June 2003

ER -

An approach for microprobe measurement and modeling for millimeter-wave application

Abstract

Other files and links

Fingerprint

Cite this