An abnormal dielectric relaxation phenomenon observed in PbZr _0.38 Ti_0.62 O₃ multilayers

We report an unusual dielectric relaxation phenomenon associated with dipolar defect complexes Ti3+ - (V o2-) observed in the PbZr_0.38 Ti_0.62 O₃ multilayers. The dielectric loss aroused by the polarization of defect dipoles varies with time under ac electric fields, and its change can be controlled by an applied dc bias. This abnormally dynamic behavior of dielectric loss can be interpreted by the formation and dissociation of dipolar defect pairs Ti3+ - (V o2-) by injection of charged carriers. These investigations may be beneficial to getting further insight into the defect dynamics and the mechanism of ferroelectric polarization fatigue and restoration in ferroelectric materials.