Amorphization induced in crystalline GeSb2Te4 films by single femtosecond pulses

Su Mei Huang*, Cai Xia Jin, Shi Yong Huang, Yi Mei Chen, Zhen Jie Zhao, Zhuo Sun

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

1 Scopus citations

Abstract

The dynamics and the conditions of amorphous transitions induced in a GeSb2Te4 system upon a single 108 fs pulse melting were studied by real-time optical microscope measurements. The system has a multilayer structure of 100 nm ZnS-SiO2/35 nm GeSb2Te4/120 nm ZnS-SiO2/0.6 mm polycarbonate substrate. The amorphization is completed within 2.6 ns. The thickness of the phase change layer plays an important role in controlling the heat flow conditions in the system upon a fs pulse irradiation. The relative thermal process and effects are analyzed. The mechanism of crystalline to amorphous transition triggered by single femtosecond laser pulse is discussed.

Original languageEnglish
Pages (from-to)156-159
Number of pages4
JournalZhongguo Jiguang/Chinese Journal of Lasers
Volume34
Issue numberSUPPL.
StatePublished - Apr 2007
Externally publishedYes

Keywords

  • Femtosecond laser
  • Optic disk
  • Optical recording
  • Phase change
  • Pumping detection
  • Thin film

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