Abstract
The dynamics and the conditions of amorphous transitions induced in a GeSb2Te4 system upon a single 108 fs pulse melting were studied by real-time optical microscope measurements. The system has a multilayer structure of 100 nm ZnS-SiO2/35 nm GeSb2Te4/120 nm ZnS-SiO2/0.6 mm polycarbonate substrate. The amorphization is completed within 2.6 ns. The thickness of the phase change layer plays an important role in controlling the heat flow conditions in the system upon a fs pulse irradiation. The relative thermal process and effects are analyzed. The mechanism of crystalline to amorphous transition triggered by single femtosecond laser pulse is discussed.
| Original language | English |
|---|---|
| Pages (from-to) | 156-159 |
| Number of pages | 4 |
| Journal | Zhongguo Jiguang/Chinese Journal of Lasers |
| Volume | 34 |
| Issue number | SUPPL. |
| State | Published - Apr 2007 |
| Externally published | Yes |
Keywords
- Femtosecond laser
- Optic disk
- Optical recording
- Phase change
- Pumping detection
- Thin film