Aging-Temperature-and-Propagation Induced Pulse-Broadening Aware Soft Error Rate Estimation for nano-Scale CMOS

Aibin Yan; Yafei Ling; Kang Yang; Zhili Chen; Maoxiang Yi

doi:10.1109/ATS.2018.00027

Aging-Temperature-and-Propagation Induced Pulse-Broadening Aware Soft Error Rate Estimation for nano-Scale CMOS

Aibin Yan^*
, Yafei Ling
, Kang Yang
, Zhili Chen
, Maoxiang Yi

^*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

3 Scopus citations

Abstract

This paper presents an aging-temperature-and-propagation induced pulse-broadening aware soft error rate (SER) estimation for nano-scale CMOS. To calculate the SER of circuits, logical masking effect, electrical effect and timing masking effect should be considered. In logical masking effect, a hybrid method using four-value probability and two-value probability is used; in electrical effect, pulse broadening induced by aging, temperature and PIPB is measured; in timing masking effect, failure rate of circuits is calculated. Finally, the SER of circuits is calculated using our proposed framework. Simulation results show that the average SER-increase of ISCAS'85 circuits is 61.2% under temperature from 0 to 120°C, 17.5% under aging from 0 to 10 years, and 137.8% under temperature-and-aging from 0°C-0 year to 120°C-10 years. The SER estimation efficiency and accuracy are ensured using Monte Carlo method.

Original language	English
Title of host publication	Proceedings - 2018 IEEE 27th Asian Test Symposium, ATS 2018
Publisher	IEEE Computer Society
Pages	86-91
Number of pages	6
ISBN (Electronic)	9781538694664
DOIs	https://doi.org/10.1109/ATS.2018.00027
State	Published - 6 Dec 2018
Externally published	Yes
Event	27th IEEE Asian Test Symposium, ATS 2018 - Hefei, China Duration: 15 Oct 2018 → 18 Oct 2018

Publication series

Name	Proceedings of the Asian Test Symposium
Volume	2018-October
ISSN (Print)	1081-7735

Conference

Conference	27th IEEE Asian Test Symposium, ATS 2018
Country/Territory	China
City	Hefei
Period	15/10/18 → 18/10/18

Keywords

aging
propagation induced pulse broadening
soft error rate
temperature

Access to Document

10.1109/ATS.2018.00027

Cite this

Yan, A., Ling, Y., Yang, K., Chen, Z., & Yi, M. (2018). Aging-Temperature-and-Propagation Induced Pulse-Broadening Aware Soft Error Rate Estimation for nano-Scale CMOS. In Proceedings - 2018 IEEE 27th Asian Test Symposium, ATS 2018 (pp. 86-91). Article 8567416 (Proceedings of the Asian Test Symposium; Vol. 2018-October). IEEE Computer Society. https://doi.org/10.1109/ATS.2018.00027

@inproceedings{1909c5b1241347c79b71fe6840e7b359,

title = "Aging-Temperature-and-Propagation Induced Pulse-Broadening Aware Soft Error Rate Estimation for nano-Scale CMOS",

abstract = "This paper presents an aging-temperature-and-propagation induced pulse-broadening aware soft error rate (SER) estimation for nano-scale CMOS. To calculate the SER of circuits, logical masking effect, electrical effect and timing masking effect should be considered. In logical masking effect, a hybrid method using four-value probability and two-value probability is used; in electrical effect, pulse broadening induced by aging, temperature and PIPB is measured; in timing masking effect, failure rate of circuits is calculated. Finally, the SER of circuits is calculated using our proposed framework. Simulation results show that the average SER-increase of ISCAS'85 circuits is 61.2\% under temperature from 0 to 120°C, 17.5\% under aging from 0 to 10 years, and 137.8\% under temperature-and-aging from 0°C-0 year to 120°C-10 years. The SER estimation efficiency and accuracy are ensured using Monte Carlo method.",

keywords = "aging, propagation induced pulse broadening, soft error rate, temperature",

author = "Aibin Yan and Yafei Ling and Kang Yang and Zhili Chen and Maoxiang Yi",

note = "Publisher Copyright: {\textcopyright} 2018 IEEE.; 27th IEEE Asian Test Symposium, ATS 2018 ; Conference date: 15-10-2018 Through 18-10-2018",

year = "2018",

month = dec,

day = "6",

doi = "10.1109/ATS.2018.00027",

language = "英语",

series = "Proceedings of the Asian Test Symposium",

publisher = "IEEE Computer Society",

pages = "86--91",

booktitle = "Proceedings - 2018 IEEE 27th Asian Test Symposium, ATS 2018",

address = "美国",

}

Yan, A, Ling, Y, Yang, K, Chen, Z & Yi, M 2018, Aging-Temperature-and-Propagation Induced Pulse-Broadening Aware Soft Error Rate Estimation for nano-Scale CMOS. in Proceedings - 2018 IEEE 27th Asian Test Symposium, ATS 2018., 8567416, Proceedings of the Asian Test Symposium, vol. 2018-October, IEEE Computer Society, pp. 86-91, 27th IEEE Asian Test Symposium, ATS 2018, Hefei, China, 15/10/18. https://doi.org/10.1109/ATS.2018.00027

Aging-Temperature-and-Propagation Induced Pulse-Broadening Aware Soft Error Rate Estimation for nano-Scale CMOS. / Yan, Aibin; Ling, Yafei; Yang, Kang et al.
Proceedings - 2018 IEEE 27th Asian Test Symposium, ATS 2018. IEEE Computer Society, 2018. p. 86-91 8567416 (Proceedings of the Asian Test Symposium; Vol. 2018-October).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Aging-Temperature-and-Propagation Induced Pulse-Broadening Aware Soft Error Rate Estimation for nano-Scale CMOS

AU - Yan, Aibin

AU - Ling, Yafei

AU - Yang, Kang

AU - Chen, Zhili

AU - Yi, Maoxiang

PY - 2018/12/6

Y1 - 2018/12/6

N2 - This paper presents an aging-temperature-and-propagation induced pulse-broadening aware soft error rate (SER) estimation for nano-scale CMOS. To calculate the SER of circuits, logical masking effect, electrical effect and timing masking effect should be considered. In logical masking effect, a hybrid method using four-value probability and two-value probability is used; in electrical effect, pulse broadening induced by aging, temperature and PIPB is measured; in timing masking effect, failure rate of circuits is calculated. Finally, the SER of circuits is calculated using our proposed framework. Simulation results show that the average SER-increase of ISCAS'85 circuits is 61.2% under temperature from 0 to 120°C, 17.5% under aging from 0 to 10 years, and 137.8% under temperature-and-aging from 0°C-0 year to 120°C-10 years. The SER estimation efficiency and accuracy are ensured using Monte Carlo method.

AB - This paper presents an aging-temperature-and-propagation induced pulse-broadening aware soft error rate (SER) estimation for nano-scale CMOS. To calculate the SER of circuits, logical masking effect, electrical effect and timing masking effect should be considered. In logical masking effect, a hybrid method using four-value probability and two-value probability is used; in electrical effect, pulse broadening induced by aging, temperature and PIPB is measured; in timing masking effect, failure rate of circuits is calculated. Finally, the SER of circuits is calculated using our proposed framework. Simulation results show that the average SER-increase of ISCAS'85 circuits is 61.2% under temperature from 0 to 120°C, 17.5% under aging from 0 to 10 years, and 137.8% under temperature-and-aging from 0°C-0 year to 120°C-10 years. The SER estimation efficiency and accuracy are ensured using Monte Carlo method.

KW - aging

KW - propagation induced pulse broadening

KW - soft error rate

KW - temperature

UR - https://www.scopus.com/pages/publications/85060062981

U2 - 10.1109/ATS.2018.00027

DO - 10.1109/ATS.2018.00027

M3 - 会议稿件

AN - SCOPUS:85060062981

T3 - Proceedings of the Asian Test Symposium

SP - 86

EP - 91

BT - Proceedings - 2018 IEEE 27th Asian Test Symposium, ATS 2018

PB - IEEE Computer Society

T2 - 27th IEEE Asian Test Symposium, ATS 2018

Y2 - 15 October 2018 through 18 October 2018

ER -

Aging-Temperature-and-Propagation Induced Pulse-Broadening Aware Soft Error Rate Estimation for nano-Scale CMOS

Abstract

Publication series

Conference

Keywords

Access to Document

Other files and links

Fingerprint

Cite this