Advanced spectroscopic technique for the study of nanocontainers: Atomic force microscopy-infrared spectroscopy (AFM-IR)

  • Huangmei Zhou*
  • , Yuankai Tang
  • , Sanjun Zhang
  • *Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingChapterpeer-review

8 Scopus citations

Abstract

The emergence of a large number of nanomaterials makes it urgent to develop characterization techniques at the nanoscale. Rapidly emerging techniques, such as atomic force microscopy-infrared spectroscopy (AFM-IR), combining atomic force microscopy with infrared spectroscopy, provide scientists with means of chemical analysis and compositional imaging at the nanoscale. The chapter briefly reviews the main developments of AFM-IR in terms of its spatial resolution, highlighting the resonance enhanced AFM-IR and tapping AFM-IR, followed by detailed measurements of AFM-IR, including its spectrum acquiring, chemical imaging and measurements of mechanical and thermal properties of materials. The chapter then surveys and discusses a wide range of applications of AFM-IR for the study of nanocontainers such as, studying coatings, drug-polymer blends, drug-loading lipid-polymer membranes, metal-organic frameworks, and lipid or polymer vesicles.

Original languageEnglish
Title of host publicationSmart Nanocontainers
Subtitle of host publicationMicro and Nano Technologies
PublisherElsevier
Pages7-17
Number of pages11
ISBN (Print)9780128167700
DOIs
StatePublished - 15 Nov 2019

Keywords

  • Atomic force microscopy-infrared spectroscopy (AFM-IR)
  • Nanocontainer
  • Photothermal induced resonance (PTIR)
  • Resonance enhanced AFM-IR
  • Tapping AFM-IR

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