Absolute electroluminescence imaging of multi-junction solar cells and calibration standards

Masahiro Yoshita; Lin Zhu; Changsu Kim; Hidefumi Akiyama; Shaoqiang Chen; Toshimitsu Mochizuki; Hidehiro Kubota; Tetsuya Nakamura; Mitsuru Imaizumi; Yoshihiko Kanemitsu

doi:10.1109/PVSC.2015.7356199

Absolute electroluminescence imaging of multi-junction solar cells and calibration standards

Masahiro Yoshita, Lin Zhu, Changsu Kim, Hidefumi Akiyama, Shaoqiang Chen, Toshimitsu Mochizuki, Hidehiro Kubota, Tetsuya Nakamura, Mitsuru Imaizumi, Yoshihiko Kanemitsu

School of Communication and Electronic Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

14 Scopus citations

Abstract

We developed absolute electroluminescence (EL) calibration standards to evaluate absolute radiative-emission rates from subcells in multi-junction (MJ) solar cells. The absolute-EL-measurement system consists of an EL imaging setup and an emission-intensity-calibrated planar light-emitting diode with a circular open aperture as an emission-intensity standard. We applied this system to the measurements of the absolute EL imaging of a monolithic satellite-use InGaP/GaAs/Ge MJ solar cell. From the observed absolute EL images, we characterized external EL quantum efficiencies and internal open-circuit voltages of InGaP and GaAs subcells.

Original language	English
Title of host publication	2015 IEEE 42nd Photovoltaic Specialist Conference, PVSC 2015
Publisher	Institute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)	9781479979448
DOIs	https://doi.org/10.1109/PVSC.2015.7356199
State	Published - 14 Dec 2015
Event	42nd IEEE Photovoltaic Specialist Conference, PVSC 2015 - New Orleans, United States Duration: 14 Jun 2015 → 19 Jun 2015

Publication series

Name	2015 IEEE 42nd Photovoltaic Specialist Conference, PVSC 2015

Conference

Conference	42nd IEEE Photovoltaic Specialist Conference, PVSC 2015
Country/Territory	United States
City	New Orleans
Period	14/06/15 → 19/06/15

Keywords

EL imaging
III-V semiconductor materials
absolute electroluminescence measurement
calibration standard
external luminescence quantum efficiency
multi-junction solar cells
sub-cell diagnosis

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10.1109/PVSC.2015.7356199

Cite this

Yoshita, M., Zhu, L., Kim, C., Akiyama, H., Chen, S., Mochizuki, T., Kubota, H., Nakamura, T., Imaizumi, M., & Kanemitsu, Y. (2015). Absolute electroluminescence imaging of multi-junction solar cells and calibration standards. In 2015 IEEE 42nd Photovoltaic Specialist Conference, PVSC 2015 Article 7356199 (2015 IEEE 42nd Photovoltaic Specialist Conference, PVSC 2015). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/PVSC.2015.7356199

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title = "Absolute electroluminescence imaging of multi-junction solar cells and calibration standards",

abstract = "We developed absolute electroluminescence (EL) calibration standards to evaluate absolute radiative-emission rates from subcells in multi-junction (MJ) solar cells. The absolute-EL-measurement system consists of an EL imaging setup and an emission-intensity-calibrated planar light-emitting diode with a circular open aperture as an emission-intensity standard. We applied this system to the measurements of the absolute EL imaging of a monolithic satellite-use InGaP/GaAs/Ge MJ solar cell. From the observed absolute EL images, we characterized external EL quantum efficiencies and internal open-circuit voltages of InGaP and GaAs subcells.",

keywords = "EL imaging, III-V semiconductor materials, absolute electroluminescence measurement, calibration standard, external luminescence quantum efficiency, multi-junction solar cells, sub-cell diagnosis",

author = "Masahiro Yoshita and Lin Zhu and Changsu Kim and Hidefumi Akiyama and Shaoqiang Chen and Toshimitsu Mochizuki and Hidehiro Kubota and Tetsuya Nakamura and Mitsuru Imaizumi and Yoshihiko Kanemitsu",

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year = "2015",

month = dec,

day = "14",

doi = "10.1109/PVSC.2015.7356199",

language = "英语",

series = "2015 IEEE 42nd Photovoltaic Specialist Conference, PVSC 2015",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

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address = "美国",

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Yoshita, M, Zhu, L, Kim, C, Akiyama, H, Chen, S, Mochizuki, T, Kubota, H, Nakamura, T, Imaizumi, M & Kanemitsu, Y 2015, Absolute electroluminescence imaging of multi-junction solar cells and calibration standards. in 2015 IEEE 42nd Photovoltaic Specialist Conference, PVSC 2015., 7356199, 2015 IEEE 42nd Photovoltaic Specialist Conference, PVSC 2015, Institute of Electrical and Electronics Engineers Inc., 42nd IEEE Photovoltaic Specialist Conference, PVSC 2015, New Orleans, United States, 14/06/15. https://doi.org/10.1109/PVSC.2015.7356199

Absolute electroluminescence imaging of multi-junction solar cells and calibration standards. / Yoshita, Masahiro; Zhu, Lin; Kim, Changsu et al.
2015 IEEE 42nd Photovoltaic Specialist Conference, PVSC 2015. Institute of Electrical and Electronics Engineers Inc., 2015. 7356199 (2015 IEEE 42nd Photovoltaic Specialist Conference, PVSC 2015).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Absolute electroluminescence imaging of multi-junction solar cells and calibration standards

AU - Yoshita, Masahiro

AU - Zhu, Lin

AU - Kim, Changsu

AU - Akiyama, Hidefumi

AU - Chen, Shaoqiang

AU - Mochizuki, Toshimitsu

AU - Kubota, Hidehiro

AU - Nakamura, Tetsuya

AU - Imaizumi, Mitsuru

AU - Kanemitsu, Yoshihiko

PY - 2015/12/14

Y1 - 2015/12/14

N2 - We developed absolute electroluminescence (EL) calibration standards to evaluate absolute radiative-emission rates from subcells in multi-junction (MJ) solar cells. The absolute-EL-measurement system consists of an EL imaging setup and an emission-intensity-calibrated planar light-emitting diode with a circular open aperture as an emission-intensity standard. We applied this system to the measurements of the absolute EL imaging of a monolithic satellite-use InGaP/GaAs/Ge MJ solar cell. From the observed absolute EL images, we characterized external EL quantum efficiencies and internal open-circuit voltages of InGaP and GaAs subcells.

AB - We developed absolute electroluminescence (EL) calibration standards to evaluate absolute radiative-emission rates from subcells in multi-junction (MJ) solar cells. The absolute-EL-measurement system consists of an EL imaging setup and an emission-intensity-calibrated planar light-emitting diode with a circular open aperture as an emission-intensity standard. We applied this system to the measurements of the absolute EL imaging of a monolithic satellite-use InGaP/GaAs/Ge MJ solar cell. From the observed absolute EL images, we characterized external EL quantum efficiencies and internal open-circuit voltages of InGaP and GaAs subcells.

KW - EL imaging

KW - III-V semiconductor materials

KW - absolute electroluminescence measurement

KW - calibration standard

KW - external luminescence quantum efficiency

KW - multi-junction solar cells

KW - sub-cell diagnosis

UR - https://www.scopus.com/pages/publications/84961620145

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DO - 10.1109/PVSC.2015.7356199

M3 - 会议稿件

AN - SCOPUS:84961620145

T3 - 2015 IEEE 42nd Photovoltaic Specialist Conference, PVSC 2015

BT - 2015 IEEE 42nd Photovoltaic Specialist Conference, PVSC 2015

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 42nd IEEE Photovoltaic Specialist Conference, PVSC 2015

Y2 - 14 June 2015 through 19 June 2015

ER -

Yoshita M, Zhu L, Kim C, Akiyama H, Chen S, Mochizuki T et al. Absolute electroluminescence imaging of multi-junction solar cells and calibration standards. In 2015 IEEE 42nd Photovoltaic Specialist Conference, PVSC 2015. Institute of Electrical and Electronics Engineers Inc. 2015. 7356199. (2015 IEEE 42nd Photovoltaic Specialist Conference, PVSC 2015). doi: 10.1109/PVSC.2015.7356199

Absolute electroluminescence imaging of multi-junction solar cells and calibration standards

Abstract

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Keywords

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