Abstract
According to the single oscillator expression, based on a based on classic electromagnetic dispersion model, a simple and efficient computer program aided method for deducing the optical refractive index and thickness of a thin film from the normal-incident transmission spectrum was proposed. A dc sputtered ZnO film was analyzed using the method, The results demonstrated that the method is practicable.
| Original language | English |
|---|---|
| Pages (from-to) | 2046-2049 |
| Number of pages | 4 |
| Journal | Guangzi Xuebao/Acta Photonica Sinica |
| Volume | 38 |
| Issue number | 8 |
| State | Published - Aug 2009 |
Keywords
- Optical spectrum analysis
- Single oscillator expression
- Thin film