TY - JOUR
T1 - A Polytomous Model of Cognitive Diagnostic Assessment for Graded Data
AU - Tu, Dongbo
AU - Zheng, Chanjin
AU - Cai, Yan
AU - Gao, Xuliang
AU - Wang, Daxun
N1 - Publisher Copyright:
© 2017, Copyright © International Test Commission.
PY - 2018/7/3
Y1 - 2018/7/3
N2 - Pursuing the line of the difference models in IRT (Thissen & Steinberg, 1986), this article proposed a new cognitive diagnostic model for graded/polytomous data based on the deterministic input, noisy, and gate (Haertel, 1989; Junker & Sijtsma, 2001), which is named the DINA model for graded data (DINA-GD). We investigated the performance of a full Bayesian estimation of the proposed model. In the simulation, the classification accuracy and item recovery for the DINA-GD model were investigated. The results indicated that the proposed model had acceptable examinees' correct attribute classification rate and item parameter recovery. In addition, a real-data example was used to illustrate the application of this new model with the graded data or polytomously scored items.
AB - Pursuing the line of the difference models in IRT (Thissen & Steinberg, 1986), this article proposed a new cognitive diagnostic model for graded/polytomous data based on the deterministic input, noisy, and gate (Haertel, 1989; Junker & Sijtsma, 2001), which is named the DINA model for graded data (DINA-GD). We investigated the performance of a full Bayesian estimation of the proposed model. In the simulation, the classification accuracy and item recovery for the DINA-GD model were investigated. The results indicated that the proposed model had acceptable examinees' correct attribute classification rate and item parameter recovery. In addition, a real-data example was used to illustrate the application of this new model with the graded data or polytomously scored items.
KW - DINA model
KW - cognitive diagnostic assessment
KW - graded response model
KW - item response theory
KW - latent response
UR - https://www.scopus.com/pages/publications/85038095080
U2 - 10.1080/15305058.2017.1396465
DO - 10.1080/15305058.2017.1396465
M3 - 文章
AN - SCOPUS:85038095080
SN - 1530-5058
VL - 18
SP - 231
EP - 252
JO - International Journal of Testing
JF - International Journal of Testing
IS - 3
ER -