Abstract
VO 2 thin film synthesized by a novel sputtering oxidation coupling (SOC) method has been successfully fabricated. The experimental results show that the optimum oxidation time is 285 s and the thin film exhibits a good metal-insulator transition (MIT) approximately at 340 K. The corresponding structures and surface compositions of the films have been characterized by X-ray diffractometer and X-ray photoelectron spectroscopy separately.
| Original language | English |
|---|---|
| Pages (from-to) | 2750-2753 |
| Number of pages | 4 |
| Journal | Applied Surface Science |
| Volume | 256 |
| Issue number | 9 |
| DOIs | |
| State | Published - 15 Feb 2010 |
| Externally published | Yes |
Keywords
- Metal-insulator transition
- Sputtering oxidation coupling