A novel sputtering oxidation coupling (SOC) method to fabricate VO 2 thin film

  • Xiaofeng Xu*
  • , Anyuan Yin
  • , Xiliang Du
  • , Jiqing Wang
  • , Jiading Liu
  • , Xinfeng He
  • , Xingxing Liu
  • , Yilong Huan
  • *Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

34 Scopus citations

Abstract

VO 2 thin film synthesized by a novel sputtering oxidation coupling (SOC) method has been successfully fabricated. The experimental results show that the optimum oxidation time is 285 s and the thin film exhibits a good metal-insulator transition (MIT) approximately at 340 K. The corresponding structures and surface compositions of the films have been characterized by X-ray diffractometer and X-ray photoelectron spectroscopy separately.

Original languageEnglish
Pages (from-to)2750-2753
Number of pages4
JournalApplied Surface Science
Volume256
Issue number9
DOIs
StatePublished - 15 Feb 2010
Externally publishedYes

Keywords

  • Metal-insulator transition
  • Sputtering oxidation coupling

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