TY - GEN
T1 - A Novel Approach for Traveling Salesman Problem Via Probe Machine
AU - Duan, Changfeng
AU - Liu, Jing
AU - Xu, Jin
AU - An, Dongdong
AU - Bao, Yu
N1 - Publisher Copyright:
© 2024 IEEE.
PY - 2024
Y1 - 2024
N2 - The Traveling Salesman Problem is a combinatorial optimization problem that seeks to find the shortest path visiting a set of locations, where each location is visited exactly once, and the path returns to the starting point. Using traditional computing model to solve Traveling Salesman Problem would face the issue of state explosion. This paper proposes a solving method based on the probe machine model, greatly accelerating the solving speed. By iteratively adding probes and performing probe operations in sequence, both optimal and feasible solutions for this problem can be obtained. We developed a solver PROBE4TSP and presented its framework and execution process. Through comparative experiments, we demonstrate that this method is faster than some classical solvers for small-scale Traveling Salesman Problems, especially fewer than thirty nodes.
AB - The Traveling Salesman Problem is a combinatorial optimization problem that seeks to find the shortest path visiting a set of locations, where each location is visited exactly once, and the path returns to the starting point. Using traditional computing model to solve Traveling Salesman Problem would face the issue of state explosion. This paper proposes a solving method based on the probe machine model, greatly accelerating the solving speed. By iteratively adding probes and performing probe operations in sequence, both optimal and feasible solutions for this problem can be obtained. We developed a solver PROBE4TSP and presented its framework and execution process. Through comparative experiments, we demonstrate that this method is faster than some classical solvers for small-scale Traveling Salesman Problems, especially fewer than thirty nodes.
KW - NP problem
KW - Traveling Salesman Problem
KW - graph computing
KW - probe machine
UR - https://www.scopus.com/pages/publications/85206394801
U2 - 10.1109/QRS62785.2024.00076
DO - 10.1109/QRS62785.2024.00076
M3 - 会议稿件
AN - SCOPUS:85206394801
T3 - IEEE International Conference on Software Quality, Reliability and Security, QRS
SP - 713
EP - 723
BT - Proceedings - 2024 IEEE 24th International Conference on Software Quality, Reliability and Security, QRS 2024
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 24th IEEE International Conference on Software Quality, Reliability and Security, QRS 2024
Y2 - 1 July 2024 through 5 July 2024
ER -