A new lock-in amplifier-based deep-level transient spectroscopy test and measurement system for solar cells

Yun Jia, Xiaolei Ding, Rui Wang, Youyang Wang, Shiqi Zheng, Xiaobo Hu, Guoen Weng, Shaoqiang Chen, Takeaki Sakurai, Hidefumi Akiyama

Research output: Contribution to journalArticlepeer-review

4 Scopus citations

Abstract

A new, widely-used, lock-in amplifier-based deep-level transient spectroscopy (DLTS) test and measurement system has been developed that efficiently digitizes and analyzes through conventional DLTS methods. The fundamental principle of DLTS, using the n+p diode, is introduced first. Part of the DLTS system setup is discussed in terms of the accuracy, optimization, and processing of measurement results. The established system is subsequently applied to study deep-level traps in the antimony sulfide (Sb2S3) and the Copper Indium Gallium Selenium (CIGS) thin-film solar cell. One electron trap and one hole trap were found in each of the two solar cells, and the calculated results are within a reasonable range compared with previous reports. It is shown experimentally that the DLTS system can be employed in a variety of test scenarios and the results are fundamentally in agreement with the mainstream system performance.

Original languageEnglish
Pages (from-to)507-515
Number of pages9
JournalSolar Energy
Volume244
DOIs
StatePublished - 15 Sep 2022
Externally publishedYes

Keywords

  • CIGS
  • DLTS system
  • Deep level defects
  • SbS
  • Solar cells

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