A new 2D motion measurement method based on neighbor principal feature matching

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Traditional 2D motion measurement based on image registration estimates displacement through matching the brightness of each image block, thus causing its matching accuracy and stability on micro/nano scale to be lower. In order to improve the accuracy and stability of 2D motion measurement on micro/nano scale, a new sub-pixel displacement measurement method based on neighbor principal feature matching is proposed, considering small differences in the characteristics of the neighboring image blocks. First, the basic principle of Principal Component Analysis (PCA) is introduced based on analysis on the problems of the traditional image registration, and then neighbor principal feature matching (NPFM) combined with an off-line training is proposed in micro/nano motion measurement. Subsequently, a sequence of simulation is conduced, and the result shows its improvement, compared to traditional image registration in 2D motion measurement. Finally, a high-precision nano platform, a high power microscope and a standard grid are used together to validate our algorithm, and the result shows that the accuracy of the algorithm improves nearly 10 times more than the conventional blocks matching method. What's more, the algorithm has greater robustness in selecting the image block's position and size.

Original languageEnglish
Title of host publication2015 IEEE International Conference on Cyber Technology in Automation, Control and Intelligent Systems, IEEE-CYBER 2015
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages186-190
Number of pages5
ISBN (Electronic)9781479987290
DOIs
StatePublished - 2 Oct 2015
Externally publishedYes
Event5th Annual IEEE International Conference on Cyber Technology in Automation, Control and Intelligent Systems, IEEE-CYBER 2015 - Shenyang, China
Duration: 9 Jun 201512 Jun 2015

Publication series

Name2015 IEEE International Conference on Cyber Technology in Automation, Control and Intelligent Systems, IEEE-CYBER 2015

Conference

Conference5th Annual IEEE International Conference on Cyber Technology in Automation, Control and Intelligent Systems, IEEE-CYBER 2015
Country/TerritoryChina
CityShenyang
Period9/06/1512/06/15

Keywords

  • Block matching
  • Mico/nano image
  • Neighbor Principal Feature
  • Principal Component Analysis
  • Sub-pixel

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