TY - GEN
T1 - A method for on-wafer S-parameter measurement of a differential amplifier by using two-port network analyzer
AU - Ling, Sun
AU - Zhigong, Wang
AU - Jianjun, Gao
PY - 2005
Y1 - 2005
N2 - By analyzing the relationship of S-parameter between two-port differential and four-port single-ended networks, a method is found for measuring the S-parameter of a differential amplifier on wafer by using a normal two-port vector network analyzer. With this method, it should not especially purchase a four-port vector network analyzer. Furthermore, the method was also suitable for measuring S-parameter of any multi-port circuit by using tow-ports measurement set.
AB - By analyzing the relationship of S-parameter between two-port differential and four-port single-ended networks, a method is found for measuring the S-parameter of a differential amplifier on wafer by using a normal two-port vector network analyzer. With this method, it should not especially purchase a four-port vector network analyzer. Furthermore, the method was also suitable for measuring S-parameter of any multi-port circuit by using tow-ports measurement set.
KW - ADS software
KW - Differential amplifier
KW - S-parameter measurement
UR - https://www.scopus.com/pages/publications/33847236932
U2 - 10.1109/APMC.2005.1607003
DO - 10.1109/APMC.2005.1607003
M3 - 会议稿件
AN - SCOPUS:33847236932
SN - 078039433X
SN - 9780780394339
T3 - Asia-Pacific Microwave Conference Proceedings, APMC
BT - APMC 2005
T2 - APMC 2005: Asia-Pacific Microwave Conference 2005
Y2 - 4 December 2005 through 7 December 2005
ER -