A Lightweight Model Solution for Aluminum Material Defect Detection at the Edge

  • Zhengzhou Chen
  • , Jinhao Liang
  • , Yueling Zhang*
  • , Jiangtao Wang*
  • , Qing Zhang
  • , Gang Xu
  • *Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Defect detection models have been widely applied in industrial edge platform. However, in the field of aluminum material defect detection still have some challenges: (i) limited availability of aluminum material defect datasets and (ii) the high computational cost associated with large-scale models. To address these challenges, we propose a novel lightweight model for aluminum material defect detection. For the first challenge, we propose Positive Sample Augmentation(PSA) to effectively increase the number of samples. Additionally, we employ model pruning, knowledge distillation and model quantization to reduce inference latency and model size. We have successfully deployed this solution on real-world industrial platforms, double the running speed and reduce approximately 75% hardware costs, thereby validating the feasibility of our approach.

Original languageEnglish
Title of host publication2024 IEEE 14th International Symposium on Industrial Embedded Systems, SIES 2024
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages164-171
Number of pages8
ISBN (Electronic)9798350388633
DOIs
StatePublished - 2024
Event14th IEEE International Symposium on Industrial Embedded Systems, SIES 2024 - Chengdu, China
Duration: 23 Oct 202425 Oct 2024

Publication series

Name2024 IEEE 14th International Symposium on Industrial Embedded Systems, SIES 2024

Conference

Conference14th IEEE International Symposium on Industrial Embedded Systems, SIES 2024
Country/TerritoryChina
CityChengdu
Period23/10/2425/10/24

Keywords

  • Data Augmentation
  • Defect Detection
  • Knowledge Distillation
  • Lightweight Model
  • Model Pruning

Fingerprint

Dive into the research topics of 'A Lightweight Model Solution for Aluminum Material Defect Detection at the Edge'. Together they form a unique fingerprint.

Cite this