A 6-b 20-Gs/s 2-way time-interleaved flash ADC with automatic comparator offset calibration in 28-nm FDSOI

Yulang Feng, Hao Deng, Qingjun Fan, Runxi Zhang, Phaneendra Bikkina, Jinghong Chen

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

12 Scopus citations

Abstract

This paper presents a 6-bit 20 GS/s 2-way time-interleaved (TI) flash analog-to-digital converter (ADC) in a 28-nm FDSOI CMOS technology. Leveraging threshold voltage control via back-gate bias in FDSOI, an automatic comparator offset calibration scheme is developed, which does not require extra transistor pairs or capacitive loads in signal path, thus avoiding comparator speed degradation. To alleviate channel mismatch-induced errors in highly interleaved structure while maintaining a reasonable power efficiency, the ADC adopts a two-way TI structure with the subADC working at 10 GS/s. To further improve the ADC power efficiency, a 1-bit voltage-domain interpolation is utilized. The proposed flash ADC achieves a SNDR of 31.2 dB at Nyquist frequency with a power consumption of 204 mW, translating into a figure-of-merit (FOM) of 344 fJ/conv.-step.

Original languageEnglish
Title of host publication2020 IEEE International Symposium on Circuits and Systems, ISCAS 2020 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781728133201
StatePublished - 2020
Event52nd IEEE International Symposium on Circuits and Systems, ISCAS 2020 - Virtual, Online
Duration: 10 Oct 202021 Oct 2020

Publication series

NameProceedings - IEEE International Symposium on Circuits and Systems
Volume2020-October
ISSN (Print)0271-4310

Conference

Conference52nd IEEE International Symposium on Circuits and Systems, ISCAS 2020
CityVirtual, Online
Period10/10/2021/10/20

Keywords

  • Back-gate voltage adjustment
  • Comparator offset calibration
  • FDSOI
  • Flash ADC
  • Time-interleaved ADC

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