TY - GEN
T1 - A 500 MS/s 10-Bit Single-Channel SAR ADC with A Double-Rate Comparator
AU - Fan, Qingjun
AU - Zhang, Runxi
AU - Bikkina, Phaneendra
AU - Mikkola, Esko
AU - Chen, Jinghong
N1 - Publisher Copyright:
© 2019 IEEE.
PY - 2019/9
Y1 - 2019/9
N2 - This paper presents a 500 MS/s 10-bit single-channel SAR ADC with a reconfigurable double-rate comparator for enhanced operation speed. The proposed double-rate comparator effectively eliminates the delay caused by comparator reset from the critical path while consuming less power and reducing the clock frequency by half. A test chip is fabricated in a 28 nm FDSOI technology. Clocked at 500 MS/s,the proposed ADC achieves a SNDR of 52.7 dB and a SFDR of 62.49 dB at Nyquist with a power consumption of 1.18 mW,showing a Walden FOM of 6.7 fJ/conv.-step.
AB - This paper presents a 500 MS/s 10-bit single-channel SAR ADC with a reconfigurable double-rate comparator for enhanced operation speed. The proposed double-rate comparator effectively eliminates the delay caused by comparator reset from the critical path while consuming less power and reducing the clock frequency by half. A test chip is fabricated in a 28 nm FDSOI technology. Clocked at 500 MS/s,the proposed ADC achieves a SNDR of 52.7 dB and a SFDR of 62.49 dB at Nyquist with a power consumption of 1.18 mW,showing a Walden FOM of 6.7 fJ/conv.-step.
UR - https://www.scopus.com/pages/publications/85075933991
U2 - 10.1109/ESSCIRC.2019.8902706
DO - 10.1109/ESSCIRC.2019.8902706
M3 - 会议稿件
AN - SCOPUS:85075933991
T3 - ESSCIRC 2019 - IEEE 45th European Solid State Circuits Conference
SP - 193
EP - 196
BT - ESSCIRC 2019 - IEEE 45th European Solid State Circuits Conference
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 45th IEEE European Solid State Circuits Conference, ESSCIRC 2019
Y2 - 23 September 2019 through 26 September 2019
ER -