Skip to main navigation Skip to search Skip to main content

A 1ppm/°C and ±0.066% 3σ Accuracy Bandgap Reference with Temperature-Adaptive PTAT Scaling

  • Jiaqing Rui
  • , Liangjian Lyu*
  • , Yuting Wan
  • , Kexin Shan
  • , Wenxian Gu
  • , C. J.Richard Shi
  • , Xing Wu
  • *Corresponding author for this work
  • East China Normal University
  • University of Washington

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

This paper presents a process-independent, curvature-compensated bandgap reference. By introducing a temperature-adaptive duty-cycled resistor to scale the PTAT voltage, the design effectively compensates for CTAT nonlinearity without introducing offset errors. Fabricated in 0.18μm CMOS, the prototype chip occupies 0.068mm2 and consumes 15μA. After two-point trimming, it achieves an average temperature coefficient of 1ppm/°C and a 3σ output accuracy within ±0.066%.

Original languageEnglish
Title of host publication2026 IEEE International Solid-State Circuits Conference, ISSCC 2026
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages84-86
Number of pages3
ISBN (Electronic)9798331589363
DOIs
StatePublished - 2026
Event2026 IEEE International Solid-State Circuits Conference, ISSCC 2026 - San Francisco, United States
Duration: 15 Feb 202619 Feb 2026

Publication series

NameDigest of Technical Papers - IEEE International Solid-State Circuits Conference
Volume69
ISSN (Print)0193-6530

Conference

Conference2026 IEEE International Solid-State Circuits Conference, ISSCC 2026
Country/TerritoryUnited States
CitySan Francisco
Period15/02/2619/02/26

Fingerprint

Dive into the research topics of 'A 1ppm/°C and ±0.066% 3σ Accuracy Bandgap Reference with Temperature-Adaptive PTAT Scaling'. Together they form a unique fingerprint.

Cite this