A 0.4 V, 12.2 pW Leakage, 36.5 fJ/Step Switching Efficiency Data Retention Flip-Flop in 22 nm FDSOI

Yuxin Ji, Yuhang Zhang, Changyan Chen, Jian Zhao, Fakhrul Zaman Rokhani, Yehea Ismail, Yongfu Li

Research output: Contribution to journalArticlepeer-review

Abstract

Data-retention flip-flops (DR-FFs) efficiently maintain data during sleep mode, and retain state during transitions between active and sleep mode. This brief proposes an ultralow power DR-FF design with an improved autonomous data-retention (ADR) latch operating with a supply voltage range down to near/subthreshold, achieving a sleep mode leakage power of 12.2 pW, 1.4× - 3.8× less than the prior CMOS DR-FFs. Our proposed DR-FFs consume the lowest active mode switching efficiency of 36.5 fJ/step, 1.2× - 4×less than the prior works, and a comparable transition efficiency of 1.9 fJ/step. Furthermore, our proposed DR-FFs require minimal control signals, logic gates, and switches, significantly reducing design complexity, and avoiding the drawbacks of nonvolatile data retention FFs (NV-FFs).

Original languageEnglish
Pages (from-to)573-577
Number of pages5
JournalIEEE Transactions on Very Large Scale Integration (VLSI) Systems
Volume33
Issue number2
DOIs
StatePublished - 2025
Externally publishedYes

Keywords

  • Data/state retention
  • flip-flop
  • ultralow power

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