1+1>2: Variation-aware lifetime enhancement for embedded 3D NAND flash systems

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

7 Scopus citations

Abstract

Three-dimensional (3D) NAND flash has been developed to boost the storage capacity by stacking memory cells vertically. One critical characteristic of 3D NAND flash is its large endurance variation. With this characteristic, the lifetime will be determined by the unit with the worst endurance. However, few works can exploit the variations with acceptable overhead for lifetime improvement. In this paper, a variation-aware lifetime improvement framework is proposed. The basic idea is motivated by an observation that there is an elegant matching between unit endurance and wearing variations when wear leveling and implicit compression are applied together. To achieve the matching goal, the framework is designed from three-type-unit levels, including cell, line, and block, respectively. Series of evaluations are conducted, and the evaluation results show that the lifetime improvement is encouraging, better than that of the combination with the state-of-the-art schemes.

Original languageEnglish
Title of host publicationLCTES 2019 - Proceedings of the 20th ACM SIGPLAN/SIGBED International Conference on Languages, Compilers, and Tools for Embedded Systems, co-located with PLDI 2019
EditorsJian-Jia Chen, Aviral Shrivastava
PublisherAssociation for Computing Machinery
Pages45-56
Number of pages12
ISBN (Electronic)9781450367240
DOIs
StatePublished - 23 Jun 2019
Event20th ACM SIGPLAN/SIGBED International Conference on Languages, Compilers, and Tools for Embedded Systems, LCTES 2019, co-located with PLDI 2019 - Phoenix, United States
Duration: 23 Jun 2019 → …

Publication series

NameProceedings of the ACM SIGPLAN Conference on Languages, Compilers, and Tools for Embedded Systems (LCTES)

Conference

Conference20th ACM SIGPLAN/SIGBED International Conference on Languages, Compilers, and Tools for Embedded Systems, LCTES 2019, co-located with PLDI 2019
Country/TerritoryUnited States
CityPhoenix
Period23/06/19 → …

Keywords

  • 3D NAND Flash
  • Compression
  • Endurance
  • Variations
  • Wear Leveling

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